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Area: 561: Piezoelectric devices for frequency control and selection           Index language:

Hide details for [<u>Section 561-01: Piezoelectric vibrators for frequency control and selection</u>]Section 561-01: Piezoelectric vibrators for frequency control and selection
561-01-01
adjustment tolerance
561-01-02
ageing tolerance
561-01-03
ageing, <of a piezoelectric resonator>
561-01-04
anti-resonance frequency
561-01-05
bus bar
561-01-06
capacitance ratio
561-01-07
centre frequency
561-01-08
clamped capacitance, <of a piezoelectric resonator>
561-01-09
coaxial dielectric resonator
561-01-10
coplanar resonator
561-01-11
coupling factor, <of SAW materials>
561-01-12
crystal element
561-01-13
crystal resonator
561-01-14
crystal unit
561-01-15
DC breakdown voltage
561-01-16
dielectric material
561-01-17
dielectric resonator
561-01-18
dielectric support
561-01-19
drive level
561-01-20
drive level dependency
561-01-21
electrode, <of a piezoelectric resonator>
561-01-22
electromechanical coupling factor, <of a piezoelectric resonator>
561-01-23
enclosure, <of a piezoelectric device>
561-01-24
equivalent circuit, <of a piezoelectric resonator>
561-01-25
external quality factor
561-01-26
figure of merit
561-01-27
fractional load resonance frequency offset
561-01-28
fractional pulling range
561-01-29
free capacitance, <of a piezoelectric resonator>
561-01-30
frequency of minimum impedance
561-01-31
frequency of maximum impedance
561-01-32
frequency pulling range
561-01-33
frequency tolerance
561-01-34
frequency range, <of a resonator unit>
561-01-35
fundamental crystal unit
561-01-36
fundamental mode
561-01-37
half wavelength resonator
561-01-38
hybrid mode dielectric resonator
561-01-39
input capacitance, <of a two-port SAW resonator>
561-01-40
insertion attenuation, <of a two-port SAW resonator>
561-01-41
IDT
561-01-42
load capacitance
561-01-43
load resonance resistance
561-01-44
load resonance frequency
561-01-45
load resonance frequency offset
561-01-46
loaded quality factor
561-01-47
mass loading, <of a SAW device>
561-01-48
metal strip array
561-01-49
microstripline resonator
561-01-50
mode of vibration
561-01-51
motional capacitance
561-01-52
motional inductance
561-01-53
motional resistance
561-01-54
motional resonance frequency
561-01-55
mounting system, <of a resonator>
561-01-56
multimode dielectric resonator
561-01-57
one-port SAW resonator
561-01-58
operable temperature range, <of a resonator>
561-01-59
operating phase shift
561-01-60
operating temperature range, <of a device>
561-01-61
output capacitance, <of a two-port SAW resonator>
561-01-62
overall frequency tolerance
561-01-63
overtone crystal unit
561-01-64
overtone mode
561-01-65
overtone order
561-01-66
parallel resonance frequency
561-01-67
partially clamped capacitance
561-01-68
piezoelectric ceramic element
561-01-69
piezoelectric ceramic resonator
561-01-70
piezoelectric resonator unit
561-01-71
piezoelectric stiffened mode of vibration
561-01-72
piezoelectric unstiffened mode of vibration
561-01-73
pulling sensitivity
561-01-74
quality factor for a series resonance circuit, <of a resonator>
561-01-75
quarter wavelength resonator
561-01-76
reference temperature, <of a resonator>
561-01-77
relative frequency spacing
561-01-78
resonance frequency
561-01-79
resonance frequency, <of a dielectric resonator>
561-01-80
resonance resistance
561-01-81
shunt capacitance
561-01-82
socket
561-01-83
spurious resonance
561-01-84
spurious resonance rejection
561-01-85
stripline resonator
561-01-86
SAW
561-01-87
SAWR
561-01-88
tolerance over the temperature range
561-01-89
transverse spurious resonance, <of a SAW device>
561-01-90
transverse electric mode dielectric resonator
561-01-91
transverse electromagnetic mode
561-01-92
TEM mode dielectric resonator
561-01-93
tuning inductance, <of a two-port SAW resonator>
561-01-94
two-port SAW resonator
561-01-95
unloaded quality factor, <of a dielectric resonator>
561-01-96
working frequency
Hide details for [<u>Section 561-02: Characteristics of piezoelectric resonators</u>]Section 561-02: Characteristics of piezoelectric resonators
561-02-01
apodization of IDT
561-02-02
available power
561-02-03
band pass filter
561-02-04
band stop filter
561-02-05
comb filter
561-02-06
coupling factor for dielectric filters
561-02-07
cut-off frequency
561-02-08
dispersive filter
561-02-09
distortion of envelope delay time, <in an electrical network>
561-02-10
envelope delay time
561-02-11
feed-through signals
561-02-12
feed-through signal suppression
561-02-13
fractional bandwidth
561-02-14
frequency asymmetrical filter
561-02-15
frequency symmetrical filter
561-02-16
group delay time
561-02-17
group delay distortion
561-02-18
high-pass filter
561-02-19
interdigitated interdigital transducer
561-02-20
input impedance
561-02-21
input level
561-02-22
insertion attenuation, <of a filter>
561-02-23
intermodulation distortion
561-02-24
ladder filter
561-02-25
lattice filter
561-02-26
low-pass filter
561-02-27
maximum level
561-02-28
mid-band frequency, <of a band-pass filter or a band-stop filter>
561-02-29
minimum insertion attenuation
561-02-30
multiphase transducer
561-02-31
nominal frequency
561-02-32
nominal group delay
561-02-33
nominal insertion attenuation
561-02-34
nominal level
561-02-35
output impedance
561-02-36
output level
561-02-37
pass band, <of a piezoelectric filter>
561-02-38
pass bandwidth
561-02-39
pass-band ripple, <of a filter>
561-02-40
pass-band attenuation deviation
561-02-41
phase delay time
561-02-42
power flow vector
561-02-43
power flow angle
561-02-44
phase distortion, <of an electrical network>
561-02-45
rated level
561-02-46
reference frequency
561-02-47
reference temperature
561-02-48
reflected wave signal suppression
561-02-49
reflector
561-02-50
reflection coefficient
561-02-51
relative attenuation
561-02-52
resonator filter
561-02-53
roll-off rate
561-02-54
return attenuation
561-02-55
surface acoustic wave filter
561-02-56
SAW beam steering
561-02-57
diffraction, <SAW>
561-02-58
selectivity
561-02-59
shape factor, <of a band-pass filter or a band-stop filter>
561-02-60
shielding electrode
561-02-61
spurious attenuation
561-02-62
spurious reflections
561-02-63
spurious response
561-02-64
spurious response rejection
561-02-65
stop band, <of a piezoelectric filter>
561-02-66
stop bandwidth
561-02-67
storage temperature range
561-02-68
suppression corrugation
561-02-69
temperature characteristics of mid-band frequency
561-02-70
temperature coefficient of mid-band frequency
561-02-71
temperature cyclic drift of mid-band frequency
561-02-72
terminating impedance
561-02-73
total power loss
561-02-74
transducer attenuation
561-02-75
transducer phase
561-02-76
transition band
561-02-77
transversal filter
561-02-78
trap attenuation
561-02-79
trap frequency
561-02-80
triple transit echo
561-02-81
TTE ripple
561-02-82
unidirectional interdigital transducer
561-02-83
unwanted response
Hide details for [<u>Section 561-03: Piezoelectric filters</u>]Section 561-03: Piezoelectric filters
561-03-01
adjustment frequency
561-03-02
Allan variance of fractional frequency fluctuation
561-03-03
amplitude modulation distortion
561-03-04
crystal cut
561-03-05
decay time
561-03-06
electrostatic discharge
561-03-07
frequency adjustment range
561-03-08
frequency/load coefficient
561-03-09
frequency offset
561-03-10
frequency tolerance, <of an oscillator>
561-03-11
frequency/voltage coefficient
561-03-12
harmonic distortion, <of an oscillator>
561-03-13
incidental frequency modulation
561-03-14
latch-up
561-03-15
linearity of frequency modulation deviation
561-03-16
long-term frequency stability
561-03-17
maximum time interval error
561-03-18
operating temperature range, <of an oscillator>
561-03-19
oven controlled crystal oscillator
561-03-20
overtone crystal controlled oscillator
561-03-21
phase jitter
561-03-22
phase noise
561-03-23
pulse duration
561-03-24
reference point temperature
561-03-25
reference temperature, <of an oscillator>
561-03-26
retrace characteristics
561-03-27
rise time
561-03-28
fractional frequency fluctuation
561-03-29
short-term frequency stability
561-03-30
simple packaged crystal oscillator
561-03-31
spectral purity
561-03-32
spurious oscillations
561-03-33
stabilization time
561-03-34
start-up time
561-03-35
symmetry
561-03-36
temperature compensated crystal oscillator
561-03-37
thermal transient frequency stability
561-03-38
time deviation
561-03-39
time interval error
561-03-40
tri-state output
561-03-41
voltage controlled crystal oscillator
Hide details for [<u>Section 561-04: Piezoelectric crystal controlled oscillators</u>]Section 561-04: Piezoelectric crystal controlled oscillators
561-04-01
AT-cut plate
561-04-02
as-grown Y-bar
561-04-03
as-grown Z-bar
561-04-04
as-grown synthetic quartz crystal
561-04-05
autoclave
561-04-06
dislocations
561-04-07
dopant
561-04-08
as-grown effective Z dimension
561-04-09
electrical twins
561-04-10
etch channel
561-04-11
gross dimensions
561-04-12
growth zones
561-04-13
hydrothermal crystal growth
561-04-14
impurity concentration
561-04-15
inclusions
561-04-16
infrared absorption coefficient
561-04-17
lumbered synthetic quartz crystal
561-04-18
lumbered Y-bar
561-04-19
lumbered Z-bar
561-04-20
minimum Z-dimension
561-04-21
optical twins
561-04-22
orientation, <of a synthetic quartz crystal>
561-04-23
pre-dimensioned bar
561-04-24
orthogonal axial system for quartz
561-04-25
reference surface
561-04-26
right-handed quartz or left-handed quartz
561-04-27
seed
561-04-28
seed veil
561-04-29
synthetic quartz crystal
561-04-30
synthetic quartz crystal batch
561-04-31
twins, pl
561-04-32
X-cut plate
561-04-33
Y-cut plate
561-04-34
Z-cut plate
561-04-35
z (minor rhombohedral) cut plate
Hide details for [<u>Section 561-05: Synthetic quartz crystal</u>]Section 561-05: Synthetic quartz crystal
561-05-01
ageing, <of a material>
561-05-02
bulk acoustic wave
561-05-03
coupling factor, <of a piezoelectric ceramic>
561-05-04
Curie temperature, <of a piezoelectric material>
561-05-05
electric polarization
561-05-06
expansion vibration
561-05-07
ferroelectric material
561-05-08
flexural vibration
561-05-09
frequency constant
561-05-10
insulation resistance
561-05-11
length vibration
561-05-12
permittivity
561-05-13
piezoelectric ceramics
561-05-14
piezoelectric effect
561-05-15
polarization
561-05-16
remanent polarization
561-05-17
spontaneous polarization
561-05-18
trapped vibration mode
Hide details for [<u>Section 561-06: Surface acoustic wave filters</u>]Section 561-06: Surface acoustic wave filters
561-06-01
dielectric resonator material
561-06-02
electric constant of vacuum
561-06-03
relative permittivity
561-06-04
loss angle
561-06-05
electric loss factor
561-06-06
quality factor of a material
561-06-07
temperature coefficient of permittivity
561-06-08
coefficient of linear thermal expansion
561-06-09
complex relative permittivity
Hide details for [<u>Section 561-07: Characteristics of surface acoustic wave (SAW) devices</u>]Section 561-07: Characteristics of surface acoustic wave (SAW) devices
561-07-01
acceptable quality level
561-07-02
back surface roughness
561-07-03
bevel
561-07-04
chip
561-07-05
congruent composition
561-07-06
contamination
561-07-07
crack
561-07-08
description of orientation and SAW propagation
561-07-09
diameter of wafer
561-07-10
dimple
561-07-11
FQA
561-07-12
FPD
561-07-13
lattice constant
561-07-14
lanthanum gallium silicate
561-07-15
lithium niobate
561-07-16
LT
561-07-17
lithium tetraborate
561-07-18
LTV
561-07-19
orange peel
561-07-20
orientation flat
561-07-21
percent local thickness variation
561-07-22
pit
561-07-23
polarization process
561-07-24
reduced LN
561-07-25
reduced LT
561-07-26
reduction process
561-07-27
reference plane
561-07-28
scratch
561-07-29
secondary flat
561-07-30
single domain
561-07-31
site
561-07-32
sori
561-07-33
ST-cut
561-07-34
surface orientation
561-07-35
tolerance of surface orientation
561-07-36
thickness variation for five points
561-07-37
total thickness variation
561-07-38
warp
561-07-39
wafer thickness


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