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Area Piezoelectric,dielectric and electrostatic devices and associated materials for frequency control, selection and detection / Materials for Surface Acoustic Wave (SAW) devices

IEV ref561-07-06

en
contamination
foreign matter on the surface of a wafer which cannot be removed after cleaning

fr
contamination, f
matière étrangère sur la surface de la tranche qui ne peut pas être retirée après un nettoyage

ar
تلوث

de
Verunreinigung, <eines Wafers> f

es
contaminación

it
contaminazione

ko
오염

ja
汚れ

pl
zanieczyszczenie, n

pt
contaminação

zh
污染

Publication date: 2014-11
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