International
Electrotechnical
Commission
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Area
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
/ Materials for Surface Acoustic Wave (SAW) devices
IEV ref
561-07-06
en
contamination
foreign matter on the surface of a wafer which cannot be removed after cleaning
fr
contamination
, f
matière étrangère sur la surface de la tranche qui ne peut pas être retirée après un nettoyage
ar
تلوث
de
Verunreinigung, <eines Wafers> f
es
contaminación
it
contaminazione
ko
오염
ja
汚れ
pl
zanieczyszczenie, n
pt
contaminação
zh
污染
Publication date:
2014-11
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